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1 article(s) from Otón, José Manuel

Morphology of SiO₂ films as a key factor in alignment of liquid crystals with negative dielectric anisotropy

Volodymyr Tkachenko,
Antigone Marino,
Eva Otón,
Noureddine Bennis and
Josè Manuel Otón

Beilstein J. Nanotechnol. 2016, 7, 1743–1748, doi:10.3762/bjnano.7.167

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Figure 1: Incidence of the probe beam on the sample and the laboratory (x',y',z') and the sample (x,y,z) coor...

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Figure 2: Porosity of SiO₂ films vs angle of deposition (filled squares). Also shown are corrected data from [16]...

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Figure 3: The anisotropic refractive index (nonfilled symbols) of porous SiO₂ at λ = 532 nm vs angle of depos...

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Figure 4: SiO₂ column tilt vs the SiO₂ deposition angle. The experimental data from [15] and the curves simulated...

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Figure 5: LC pretilt vs the SiO₂ deposition angle. The experimental data from [2] and [3] are shown for comparison.

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Published 17 Nov 2016

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Morphology of SiO2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropy

Morphology of SiO₂ films as a key factor in alignment of liquid crystals with negative dielectric anisotropy